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Benchtop surface & thickness metrology
FlagshipIn Production
QuickPRO-CUBE™
QuickPRO™ · Surface & Thickness Metrology
The benchtop QuickPRO™ — a compact measurement cube that pairs chromatic confocal and interferometric sensors to capture 3D surface topography and dual-sided thickness on optics, PCBs, and wafers in minutes, at less than ¼ the price of comparable systems.
Accuracy< 1µm
Scan time< 2min
vs. comparable¼price
Configuration highlights
Compact benchtop cube footprint
Chromatic confocal + interferometric sensing on one platform
Dual-sided thickness measurement without contact
Sub-micron form accuracy in minutes
Specifications
Measurement
Surface accuracy< 1µm
Thickness resolution0.1µm
Lateral resolution2µm
SensingChromatic confocal + IFM
Throughput & capacity
Scan time< 2min
Sided scanningDualsides
TargetsOptics · PCB · Wafer
OriginUSA
QuickPRO-CUBE™ specifications
Performance figures reflect the QuickPRO™ metrology platform. Contact our applications engineers for the exact configuration and options of the QuickPRO-CUBE™ for your samples.
Best suited for
Lens topographyThin-film thicknessPCB inspectionWafer flatnessCoating uniformity
Configure the QuickPRO-CUBE™ for your needs
Tell us about your samples and tolerances — we reply within one business day.